Method for post-mortem pathomorphologic examination of brain in cases of encephalopathy

Silvija Roga; Andrejs Pavārs; Jānis Gardovskis; Uldis Berķis

Method for post-mortem pathomorphologic examination of brain in cases of encephalopathy

Translated title of the contribution: Galvas smadzeņu audu stāvokļa pēcnāves noteikšanas patomorfoloģiskais paņēmiens encefalopātijas gadījumā

Silvija Roga (Inventor), Andrejs Pavārs (Inventor), Jānis Gardovskis (Inventor), Uldis Berķis (Inventor)

Rīga Stradiņš University

Research output: Intellectual property › Patent

Abstract

Invention relates to pathomorphology and particularly to post‑mortem method of brain examination in cases of encephalopathy. The method comprises determination of skull vault’s largest span along the midline of the skull’s inner surface, skull vault’s largest span along the midline of the skull’s outer surface, cutting a straight fronto‑parietal line of underside of the two hemispheres, determining the outer distance between the brain’s frontal horns and a distance along the midline of the lateral ventricle. All measurments taken are compared by given formula

Translated title of the contribution	Galvas smadzeņu audu stāvokļa pēcnāves noteikšanas patomorfoloģiskais paņēmiens encefalopātijas gadījumā
Original language	Latvian
Patent number	14933
IPC	A61B5/107
Priority date	9/09/14
Filing date	9/09/14
Publication status	Published - 20 May 2015

Keywords*

pathomorphologic examination of brain

Field of Science*

3.2 Clinical medicine

Patent expiration date

01.04.2021

Access to Document

http://databases.lrpv.gov.lv/databases/lv/patent/details/p-14-75/

Cite this

@misc{83476ede7d3640f78378e62609e7ba77,

title = "Method for post-mortem pathomorphologic examination of brain in cases of encephalopathy",

abstract = "Invention relates to pathomorphology and particularly to post‑mortem method of brain examination in cases of encephalopathy. The method comprises determination of skull vault{\textquoteright}s largest span along the midline of the skull{\textquoteright}s inner surface, skull vault{\textquoteright}s largest span along the midline of the skull{\textquoteright}s outer surface, cutting a straight fronto‑parietal line of underside of the two hemispheres, determining the outer distance between the brain{\textquoteright}s frontal horns and a distance along the midline of the lateral ventricle. All measurments taken are compared by given formula",

keywords = "pathomorphologic examination of brain",

author = "Silvija Roga and Andrejs Pavārs and Jānis Gardovskis and Uldis Berķis",

year = "2015",

month = may,

day = "20",

language = "Latvian",

publisher = "Patent Office of the Republic of Latvia",

type = "Patent",

note = "14933; A61B5/107 ",

}

TY - PAT

T1 - Method for post-mortem pathomorphologic examination of brain in cases of encephalopathy

AU - Roga, Silvija

AU - Pavārs, Andrejs

AU - Gardovskis, Jānis

AU - Berķis, Uldis

PY - 2015/5/20

Y1 - 2015/5/20

N2 - Invention relates to pathomorphology and particularly to post‑mortem method of brain examination in cases of encephalopathy. The method comprises determination of skull vault’s largest span along the midline of the skull’s inner surface, skull vault’s largest span along the midline of the skull’s outer surface, cutting a straight fronto‑parietal line of underside of the two hemispheres, determining the outer distance between the brain’s frontal horns and a distance along the midline of the lateral ventricle. All measurments taken are compared by given formula

AB - Invention relates to pathomorphology and particularly to post‑mortem method of brain examination in cases of encephalopathy. The method comprises determination of skull vault’s largest span along the midline of the skull’s inner surface, skull vault’s largest span along the midline of the skull’s outer surface, cutting a straight fronto‑parietal line of underside of the two hemispheres, determining the outer distance between the brain’s frontal horns and a distance along the midline of the lateral ventricle. All measurments taken are compared by given formula

KW - pathomorphologic examination of brain

UR - https://www.lrpv.gov.lv/lv/media/1058/download

M3 - Patent

M1 - 14933

Y2 - 2014/09/09

PB - Patent Office of the Republic of Latvia

ER -

Method for post-mortem pathomorphologic examination of brain in cases of encephalopathy

Abstract

Keywords*

Field of Science*

Patent expiration date

Access to Document

Other files and links

Fingerprint

Cite this