Abstract
This review summarizes relevant research in the field of electrostatically actuated nanobeam-based nanoelectromechanical (NEM) switches. The main switch architectures and structural elements are briefly described and compared. Investigation methods that allow for exploring coupled electromechanical interactions as well as studies of mechanically or electrically induced effects are covered. An examination of the complex nanocontact behaviour during various stages of the switching cycle is provided. The choice of the switching element and the electrode is addressed from the materials perspective, detailing the benefits and drawbacks for each. An overview of experimentally demonstrated NEM switching devices is provided, and together with their operational parameters, the reliability issues and impact of the operating environment are discussed. Finally, the most common NEM switch failure modes and the physical mechanisms behind them are reviewed and solutions proposed.
Original language | English |
---|---|
Pages (from-to) | 271-300 |
Number of pages | 30 |
Journal | Beilstein Journal of Nanotechnology |
Volume | 9 |
Issue number | 1 |
DOIs | |
Publication status | Published - 25 Jan 2018 |
Externally published | Yes |
Keywords*
- Nanocontacts
- Nanoelectromechanical switches
- Nanowires
- NEM
- Reliability
Field of Science*
- 1.3 Physical sciences
- 2.5 Materials engineering
- 2.10 Nano-technology
Publication Type*
- 1.1. Scientific article indexed in Web of Science and/or Scopus database