A model of the thermoluminescence (TL) phenomenon using the contact method of sample heating, taking into account contact thermal resistance and temperature distribution across a sample, has been developed. It has been shown theoretically and confirmed experimentally that glow curve shift depends on sample height and contact resistance R0 in the case of imperfect contact between the sample and its heating element (HE). Temperature non-uniformity in the usual TL detectors with H<or=0.1 cm can be neglected. The temperature difference in a single LiF crystal sample with H=0.3 cm at a heating rate of 4.3 K s-1 is 7K. The TL intensity (normalised per height unit) at a glow curve maximum varies slightly, while Tmax shifts essentially due to H and R0 variations. Consequences of the suggested model are discussed.
Field of Science*
- 1.3 Physical sciences
- 1.1. Scientific article indexed in Web of Science and/or Scopus database