The study of thermoluminescence using the contact method of sample heating

A model of the thermoluminescence (TL) phenomenon using the contact method of sample heating, taking into account contact thermal resistance and temperature distribution across a sample, has been developed. It has been shown theoretically and confirmed experimentally that glow curve shift depends on sample height and contact resistance R₀ in the case of imperfect contact between the sample and its heating element (HE). Temperature non-uniformity in the usual TL detectors with H<or=0.1 cm can be neglected. The temperature difference in a single LiF crystal sample with H=0.3 cm at a heating rate of 4.3 K s^-1 is 7K. The TL intensity (normalised per height unit) at a glow curve maximum varies slightly, while T_max shifts essentially due to H and R₀ variations. Consequences of the suggested model are discussed.